Fe thicknesses dependence of attenuated total reflection response in magnetoplasmonic double dielectric structures: angular versus wavelength interrogation-Reference-Cited by-同舟云学术

Fe thicknesses dependence of attenuated total reflection response in magnetoplasmonic double dielectric structures: angular versus wavelength interrogation

Published:2019-11-13 Issue:12 Volume:58 Page:122003
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:
Short-container-title:Jpn. J. Appl. Phys.

Author:

Kaihara Terunori,Shimodaira Takahiro,Suzuki Shogo,Cebollada Alfonso,Armelles Gaspar,Shimizu Hiromasa

Funder

Ministerio de Economía y Competitividad

Consejería de Sanidad, Comunidad de Madrid

Japan Society for the Promotion of Science

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Link

http://iopscience.iop.org/article/10.7567/1347-4065/ab5205/pdf

Reference56 articles.

1. Plasmonics beyond the diffraction limit

2. The Case for Plasmonics

3. Plasmonics: the next chip-scale technology

4. Perspective on plasmonics

5. Toward integrated plasmonic circuits

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