Disappearance of Lowest-Order Transmission Resonance in Ag Film of Critical Thickness-Reference-Cited by-同舟云学术

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Disappearance of Lowest-Order Transmission Resonance in Ag Film of Critical Thickness

Published:2011-08-01 Issue:8S3 Volume:50 Page:08LB01
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:
Short-container-title:Jpn. J. Appl. Phys.

Author:

Lu Shin-Ming,Huang Hsu-Sheng,Su Wei-Bin,Chu Pei-Hong,Chang Chia-Seng,Hsiao Hsi-Lien,Tsong Tien Tzou

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Reference31 articles.

1. Observation of quantum size effects in photoemission from Ag islands on GaAs(110)

2. Quantum-well and tight-binding analyses of spin-polarized photoemission from Ag/Fe(001) overlayers

3. Quantum-Well States as Fabry-Pérot Modes in a Thin-Film Electron Interferometer

4. Quantum-well states in copper thin films

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Characterization of apex structures of scanning tunneling microscope tips with field emission resonance energies;Japanese Journal of Applied Physics;2022-07-22

2. Effective quantum-well width of confined electrons in ultrathin Ag(111) films on Si(111)7 × 7 substrates;Surface Science;2021-02

3. Interaction of Stark-shifted image potential states with quantum well states in ultrathin Ag(111) islands on Si(111)- 3×3−B substrates;Physical Review B;2017-08-30

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