Surface Potential Measurement of Tris(8-hydroxyquinolinato)aluminum and Bis[N-(1-naphthyl)-N-phenyl]benzidine Thin Films Fabricated on Indium–Tin Oxide by Kelvin Probe Force Microscopy-Reference-Cited by-同舟云学术

Surface Potential Measurement of Tris(8-hydroxyquinolinato)aluminum and Bis[N-(1-naphthyl)-N-phenyl]benzidine Thin Films Fabricated on Indium–Tin Oxide by Kelvin Probe Force Microscopy

Published:2011-07-01 Issue:7R Volume:50 Page:071601
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:
Short-container-title:Jpn. J. Appl. Phys.

Author:

Katori Shigetaka,Satoh Nobuo,Yahiro Masayuki,Kobayashi Kei,Yamada Hirofumi,Matsushige Kazumi,Fujita Shizuo

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Reference36 articles.

1. Electroluminescence in Organic Crystals

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5. Multilayer White Light-Emitting Organic Electroluminescent Device

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