Structure, electrical and gas sensor properties of Sn-Y-O thin films, prepared by reactive ion-beam sputtering-Reference-Cited by-同舟云学术

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Structure, electrical and gas sensor properties of Sn-Y-O thin films, prepared by reactive ion-beam sputtering

Published:2018 Issue:2 Volume:8 Page:196-201
ISSN:2218-5046
Container-title:Letters on Materials
language:
Short-container-title:LoM

Author:

Babkina I. V.,Zhilova O. V.,Kalinin Yu. Ye.,Makagonov V. A.,Remizova O. I.,Sitnikov A. V.

Publisher

Institute for Metals Superplasticity Problems of RAS

Subject

General Materials Science

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Influence of silicon impurity on the structure and physical properties of Sn-Si-O films;Letters on Materials;2020

2. Influence of Al impurities on the electrical properties of ZnO films;Letters on Materials;2019

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