Thickness–stress relations in aluminum thin films
Author:
Affiliation:
1. a Instituto de Ciencia de Materiales , CSIC Campus Cantoblanco, Madrid , 28049 , Spain
2. b Department of Applied Physics , CINVESTAV-IPN , Unidad Merida, A.P. 73-Cordemex, Merida , Yucatan , 97310 , Mexico
Publisher
Informa UK Limited
Subject
Industrial and Manufacturing Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science
Link
https://www.tandfonline.com/doi/pdf/10.1081/AMP-120002797
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5. The effects of substrate surface steps on the microstructure of epitaxial Ba2YCu3O7−x thin films on (001) LaAlO3
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