Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Reference14 articles.
1. Accelerated Life Testing (ALT) in Microelectronics and Photonics: Its Role, Attributes, Challenges, Pitfalls, and Interaction With Qualification Tests1
2. Nelson, W.: ‘Accelerated testing: statistical models, test plans, and data analysis’, (Wiley, New Jersey, USA 2004), p. 601
3. Toward comprehensive reliability assessment of electronics by a combined loading approach
4. Modeling of Combined Temperature Cycling and Vibration Loading on PBGA Solder Joints Using an Incremental Damage Superposition Approach
5. System-level reliability testing a frequency converter with simultaneous stresses
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