Current residual‐based method for open‐circuit fault diagnosis in single‐phase PWM converter
Author:
Affiliation:
1. School of Electrical EngineeringSouthwest Jiaotong UniversityChengduPeople's Republic of China
2. Chengdu Yunda Technology Co., LtdChengduPeople's Republic of China
Funder
National Natural Science Foundation of China
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1049/iet-pel.2018.5444
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5. Experimental Behavior of Single-Chip IGBT and COOLMOS Devices Under Repetitive Short-Circuit Conditions
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