Differentiation of roughness and surface defect impact on dielectric strength of polymeric thin films

Author:

Tan Daniel Qi1ORCID

Affiliation:

1. Technion Israel Institute of Technology and Guangdong Technion Israel Institute of Technology, Materials Science and Engineering241 Daxue Road, Jinping DistrictShantouGuangdong 515063People's Republic of China

Publisher

Institution of Engineering and Technology (IET)

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference24 articles.

1. ASTM D3755 – 14 and ASTM D149: ‘Standard test method for dielectric breakdown voltage and dielectric strength of solid electrical insulating materials under direct‐voltage stress’ ‘Test method for dielectric breakdown voltage and dielectric strength of solid electrical insulating materials at commercial power frequencies’ ASTM International West Conshohocken PA 2014. Available atwww.astm.org accessed on Jan. 30 2020

2. High-Temperature Capacitor Polymer Films

3. Dielectric response of structured multilayered polymer films fabricated by forced assembly

4. HoJ.BoggsS.: ‘Effect of UV treatment on the dielectric strength of BOPP capacitor film’.IEEE Int. Symp. Electrical Insulation (ISEI) 2006 p.314317

5. HoJ.JowT.R.: ‘Characterization of high temperature polymer thin films for power conditioning capacitors’. ARL Technical Report ARL‐TR‐4880 2009

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