Electro-optic sampling of optoelectronically phase-locked 10.0 GHz microwave signals using semiconductor laser diodes
Author:
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Link
https://digital-library.theiet.org/content/journals/10.1049/el_19911014?crawler=true&mimetype=application/pdf
Reference8 articles.
1. Valdmanis, J.A.: ‘Electro-optic measurement techniques for picosecond materials, devices and integrated circuits’, Marcus, R.B., Measurements of high speed signal in solid state devices, semiconductors and semimetals, (Academic Press 1990),28, p. 136–219
2. Wiesenfeld, J.M., and Jain, R.K.: ‘Direct optical probing of integrated circuits and high speed devices’, Marcus, R.B., Measurements of high speed signals in solid state devices, semiconductors and semimetals, (Academic press 1990),28, p. 221–334 (and references therein)
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