9.2 W∕mm (13.8 W) AlGaN∕GaN HEMTs at 10 GHz and 55 V drain bias

Author:

Zhang A.P.,Rowland L.B.,Kaminsky E.B.,Tucker J.B.,Kretchmer J.W.,Allen A.F.,Cook J.,Edward B.J.

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering

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3. Investigating the effect of off-state stress on trap densities in AlGaN/GaN high electron mobility transistors;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2011-11

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