Sensitive 320 Gbit∕s eye diagram measurements via optical sampling with semiconductor optical amplifier-ultrafast nonlinear interferometer
Author:
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Link
https://digital-library.theiet.org/content/journals/10.1049/el_20030681?crawler=true&mimetype=application/pdf
Reference5 articles.
1. Measuring eye diagram of 320 Gbit/s optical signal by optical sampling using passively modelocked fibre laser
2. 300-Gb/s eye-diagram measurement by optical sampling using fiber-based parametric amplification
3. A compact optical sampling measurement system using mode-locked laser-diode modules
4. Simple setup for simultaneous optical clock recovery and ultra-short sampling pulse generation
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1. Generalized Linear Optical Sampling Technique Realized by Using Non-Pulse Electro-Optic Frequency Comb Sampling Source;IEEE Access;2020
2. Integrated nonlinear interferometer with wavelength multicasting functionality;Optics Express;2016-08-01
3. Optical waveform monitoring based on a free-running mode-locked femtosecond fibre laser and four-wave mixing in a highly nonlinear fibre;Opto-Electronics Review;2016-01-01
4. Low-Complexity TOAD-Based All-Optical Sampling Gate With Ultralow Switching Energy and High Linearity;IEEE Photonics Journal;2015-08
5. High-resolution, low-injection-signal-power optical sampling;Optical and Quantum Electronics;2015-05-05
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