Characterisation of electromagnetic susceptibility of integrated circuits using near-field scan-Reference-Cited by-同舟云学术

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Characterisation of electromagnetic susceptibility of integrated circuits using near-field scan

Published:2007 Issue:1 Volume:43 Page:15
ISSN:0013-5194
Container-title:Electronics Letters
language:en
Short-container-title:Electron. Lett.

Author:

Boyer A.,Bendhia S.,Sicard E.

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering

Link

https://digital-library.theiet.org/content/journals/10.1049/el_20073130?crawler=true&mimetype=application/pdf

Reference6 articles.

1. Sketoe, J.G.: ‘Integrated circuit electromagnetic immunity handbook’, NASA∕CR-2000-210017 2000)

2. ‘Characterization of integrated circuits electromagnetic immunity’, IEC Standard, 2003),IEC 62132

3. ‘Measurement of electromagnetic emissions, 150 kHz to 1 GHz – surface scan method’, IEC Standard, 2003),IEC 61967-3

4. EMI-induced failures in crystal oscillators

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