Validating S‐parameter measurements of RF integrated circuits at milli‐Kelvin temperatures-Reference-Cited by-同舟云学术

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Validating S‐parameter measurements of RF integrated circuits at milli‐Kelvin temperatures

Published:2022-06-18 Issue:16 Volume:58 Page:614-616
ISSN:0013-5194
Container-title:Electronics Letters
language:en
Short-container-title:Electronics Letters

Author:

Stanley M.¹,Parker‐Jervis R.²,de Graaf S.³,Lindström T.³,Cunningham J. E.²,Ridler N. M.¹

Affiliation:

1. Electromagnetic & Electrochemical Technologies Department National Physical Laboratory Teddington UK

2. School of Electronic and Electrical Engineering University of Leeds Leeds UK

3. Quantum Technologies Department National Physical Laboratory Teddington UK

Funder

Engineering and Physical Sciences Research Council

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1049/ell2.12545

Reference14 articles.

1. Microwaves in Quantum Computing

2. A quantum engineer's guide to superconducting qubits

3. VNA calibration

4. Characterizing Scattering Parameters of Superconducting Quantum Integrated Circuits at Milli-Kelvin Temperatures

5. Stanley M. deGraaf S.E. Lindström T. Salter M.J. Skinner J. Ridler N.M.:Design of microwave calibration standards for characterising S‐parameters of quantum integrated circuits at millikelvin temperatures.Proc. European Microwave Conference 2021 London UK(2022)

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