Electronically-scanned white light interferometry with enhanced dynamic range
Author:
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Link
https://digital-library.theiet.org/content/journals/10.1049/el_19901065?crawler=true&mimetype=application/pdf
Reference6 articles.
1. Interferometric and Polarimetric Sensors Using White-Light Interferometry
2. Prototype Industrial Multi-parameter F.O. Sensor Using White Light Interferometry
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