Cavity‐first approach for microelectromechanical system–CMOS monolithic integration

Author:

Lu Jian1,Zhang Lan1,Takagi Hideki1,Maeda Ryutaro1

Affiliation:

1. Research Center for Ubiquitous MEMS and Micro Engineering (UMEMSME)National Institute of Advanced Industrial Science and Technology (AIST)TsukubaIbaraki305‐8564Japan

Publisher

Institution of Engineering and Technology (IET)

Subject

Condensed Matter Physics,General Materials Science,Biomedical Engineering,Bioengineering

Reference21 articles.

1. TopolA.W.FurmanB.K.GuariniK.W.ShiL.CohenG.M.WalkerG.F.: ‘Enabling technologies for wafer‐level bonding of 3D MEMS and integrated circuit structures’.Proc. 54th Electronic Components and Technology Conf. (ECTC2004) Las Vegas NV USA June2004 pp.931–938

2. Wafer-Level Heterogeneous Integration for MOEMS, MEMS, and NEMS

3. ShengK.C.W.PremachandranC.S.KyondC.W.et al.: ‘C2W bonding method for MEMS applications’.Proc. 10th Electronics Packaging Technology Conf. (EPTC2008) Singapore December2008 pp.1283–1287

4. WitvrouwA.: ‘CMOS‐MEMS integration: why how and what’.Proc. IEEE/ACM Int. Conf. Computer‐aided Design San Jose CA USA November2006 pp.826–827

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