An efficient, fast, and robust algorithm for single diode model parameters estimation of photovoltaic solar cells

Author:

Ismail Husain A.12ORCID,Diab Ahmed A. Zaki2ORCID

Affiliation:

1. Electrical and Communication Engineering Department High Institute of Engineering Bilbeis Egypt

2. Electrical Engineering Department Faculty of Engineering Minia University Minia Egypt

Abstract

AbstractParameter estimation of photovoltaic (PV) solar cells and module models pays attention to researchers owing to their importance in practical considerations. The single diode model (SDM) circuit with five unknown parameters is widely used to model PV solar cells and modules. In this paper, a novel approach called alternate optimization (AO) algorithm based on a discrete search is proposed to estimate the SDM parameters. The proposed algorithm provides efficient and robust performance, considering a limited set of discrete values and increasing the convergence speed. Two practical case studies with actual measurements are considered to assess the proposed AO algorithm: the RTC France solar cell and monocrystalline PV modules with different irradiations and temperatures. The numerical findings underscore the superior performance of the proposed AO algorithm across various metrics. Notably, it achieves an exceptional Root Mean Square Error (RMSE) of 7.7426 × 10−04 for the RTC France PV cell and approximately 1 × 10−03 RMSE for monocrystalline PV modules. Additionally, the algorithm exhibits unparalleled speed, showcasing the fastest convergence with an elapsed time of 1.66 × 10−05—markedly 4.45 times quicker than the fastest method documented in the literature for SDM parameter estimation. Furthermore, the proposed AO algorithm stands out for its efficiency, requiring a maximum of five iterations for parameter estimation, a substantial improvement compared to the more than 10 iterations typically needed by algorithms in the existing literature. Its robustness is also commendable, as evidenced by the stability of final RMSE values across a variety of experiments, distinguishing it from less robust algorithms found in the literature.

Publisher

Institution of Engineering and Technology (IET)

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