MMIC internal electric field mapping with submicrometre spatial resolution and gigahertz bandwidth by means of high frequency scanning force microscope testing-Reference-Cited by-同舟云学术

MMIC internal electric field mapping with submicrometre spatial resolution and gigahertz bandwidth by means of high frequency scanning force microscope testing

Published:1995-11-23 Issue:24 Volume:31 Page:2089-2091
ISSN:0013-5194
Container-title:Electronics Letters
language:en
Short-container-title:

Author:

Leyk A.,Kubalek E.

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering

Link

https://digital-library.theiet.org/content/journals/10.1049/el_19951442?crawler=true&mimetype=application/pdf

Reference8 articles.

1. Courtois, B.: ‘CAD and testing of ICs and systems. Where are we going?’, (Centre National de la Recherche Scientifique TIMA Labs. Grenoble France 38031 1993)

2. 5-100 GHz InP coplanar waveguide MMIC distributed amplifier

3. 104 GHz signals measured by high frequency scanning force microscope test system

4. Picosecond electrical sampling using a scanning force microscope

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