Analysis of sensitivity of microwave surface resistance measurement of HTS thin films using dielectric resonator with finite shield
Author:
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Link
https://digital-library.theiet.org/content/journals/10.1049/el_19991174?crawler=true&mimetype=application/pdf
Reference4 articles.
1. Surface resistance measurements of HTS films by means of sapphire dielectric resonators
2. Microwave measurement of temperature and current dependences of surface impedance for high-T/sub c/ superconductors
3. High-T/sub c/-superconductor-sapphire microwave resonator with extremely high Q-values up to 90 K
4. Misra, M.: ‘Microwave characterisation of high temperature superconductors by resonant techniques’, 1999, PhD, University of Delhi New Delhi India
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1. Effect of dopants on the low temperature microwave dielectric properties of Ba(Zn1/3Ta2/3)O3 ceramics;Journal of Materials Science: Materials in Electronics;2006-11-02
2. How Accurately Can the Surface Resistance of Various Superconducting Films Be Measured with the Sapphire Hakki–Coleman Dielectric Resonator Technique?;Journal of Superconductivity and Novel Magnetism;2006-10-11
3. Tuning the properties of microwave dielectric resonators in a stack configuration;Materials Letters;2006-09
4. Sensitivity of surface resistance measurement of HTS thin films by cavity resonator, dielectric resonator and microstrip line resonator;Pramana;2002-05
5. Design aspects for fixed dimension TE011mode high-QHTS shielded sapphire dielectric resonators for low-temperature electronics applications;Superconductor Science and Technology;2002-02-19
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