Single event transient mitigation techniques for a cross‐coupled LC oscillator, including a single‐event transient hardened CMOS LC‐VCO circuit-Reference-Cited by-同舟云学术

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Single event transient mitigation techniques for a cross‐coupled LC oscillator, including a single‐event transient hardened CMOS LC‐VCO circuit

Published:2021-08-28 Issue: Volume: Page:
ISSN:1751-858X
Container-title:IET Circuits, Devices & Systems
language:en
Short-container-title:IET Circuits, Devices & Systems

Author:

Karthigeyan Arumugam¹²^ORCID,Radha Sankararajan¹,Manikandan Esakkimuthu³

Affiliation:

1. Department of Electronics and Communication Engineering Sri Sivasubramaniya Nadar (SSN) College of Engineering Kalavakkam India

2. Hardware Security Research Group Society for Electronic Transactions and Security Chennai India

3. School of Electronics Engineering (SENSE) Vellore Institute of Technology Chennai India

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering,Control and Systems Engineering

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1049/cds2.12094

Reference31 articles.

1. Basic mechanisms and modeling of single-event upset in digital microelectronics

2. Fine-Grain SEU Mitigation for FPGAs Using Partial TMR

3. A Methodology for Automatic Insertion of Selective TMR in Digital Circuits Affected by SEUs

4. A radiation-tolerant ring oscillator phase-locked loop in 0.13µm CMOS

5. A single-event upset robust, 2.2 GHz to 3.2 GHz, 345 fs jitter PLL with triple-modular redundant phase detector in 65 nm CMOS

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1. Design of low power and low phase noise LC-VCO for Bluetooth/WLAN applications;AEU - International Journal of Electronics and Communications;2024-04

2. Radiation Hardened by Design-based Voltage Controlled Oscillator for Low Power Phase Locked Loop Application;Journal of Electronic Testing;2024-04

3. Low power and low phase noise complementary voltage controlled oscillator optimised by a meta‐heuristic algorithm;IET Microwaves, Antennas & Propagation;2023-10-08

4. TID Sensitivity Assessment of Quadrature LC-Tank VCOs Implemented in 65-nm CMOS Technology;Electronics;2022-04-27

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