An AFM/STM multi‐mode nanofabrication approach allowing in situ surface modification and characterisation-Reference-Cited by-同舟云学术

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An AFM/STM multi‐mode nanofabrication approach allowing in situ surface modification and characterisation

Published:2013-01 Issue:1 Volume:8 Page:43-46
ISSN:1750-0443
Container-title:Micro & Nano Letters
language:en
Short-container-title:Micro & Nano Letters

Author:

Hu Weihua¹,Bain J.²,Ricketts D.³

Affiliation:

1. Department of PhysicsCarnegie Mellon UniversityPittsburghPA15213USA

2. Department of Electrical and Computer EngineeringCarnegie Mellon UniversityPittsburghPA15213USA

3. Department of Electrical and Computer EngineeringNorth Carolina State UniversityRaleighNC27606USA

Publisher

Institution of Engineering and Technology (IET)

Subject

Condensed Matter Physics,General Materials Science,Biomedical Engineering,Bioengineering

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1049/mnl.2012.0859

Reference17 articles.

1. Atomic and molecular manipulation with the scanning tunneling microscope;Stroscio J.A.;Science

2. Scanning tunneling microscopy

3. Scanning Probe Microscopy

4. Atomic Force Microscope

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Investigation of tip current and normal force measured simultaneously during local oxidation of titanium using dual‐mode scanning probe microscopy;Micro & Nano Letters;2014-05

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