Blind reconstruction of atomic force microscopy tip morphology by using porous anodic alumina membrane-Reference-Cited by-同舟云学术

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Blind reconstruction of atomic force microscopy tip morphology by using porous anodic alumina membrane

Published:2012-12-01 Issue:12 Volume:7 Page:1282-1284
ISSN:1750-0443
Container-title:Micro & Nano Letters
language:en
Short-container-title:

Author:

Han Guoqiang,He Bingwei,Chen Yuqin

Publisher

Institution of Engineering and Technology (IET)

Subject

Condensed Matter Physics,General Materials Science,Biomedical Engineering,Bioengineering

Link

https://digital-library.theiet.org/content/journals/10.1049/mnl.2012.0842?crawler=true&mimetype=application/pdf

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Mirror effect in atomic force microscopy profiles enables tip reconstruction;Scientific Reports;2020-11-03

2. Reconstruction of atomic force microscopy image using compressed sensing;Micron;2018-02

3. Growth of Porous Anodic Alumina on Low-Index Surfaces of Al Single Crystals;The Journal of Physical Chemistry C;2017-12-05

4. Blind evaluation of AFM tip shape by using optical glass surface with irregular nanostructures as a tip characteriser;Micro & Nano Letters;2017-12

5. BIAXIALLY ORIENTED POLYPROPYLENE FILM FOR AFM TIP CHARACTERIZATION;Nano;2014-04

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