Method to reduce an unwanted EM field component in a 4‐port TEM cell-Reference-Cited by-同舟云学术

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Method to reduce an unwanted EM field component in a 4‐port TEM cell

Published:2018-04 Issue:8 Volume:54 Page:488-490
ISSN:0013-5194
Container-title:Electronics Letters
language:en
Short-container-title:Electron. lett.

Author:

Choi Sungwoong¹,Jeon Sangbong¹,Kim Dongho²,Park Seong‐Ook³

Affiliation:

1. Broadcasting & Telecommunications Media Research LaboratoryETRI DaejeonRepublic of Korea

2. Department of Electronic EngineeringSejong University209 Neungdong‐roGwangjin‐gu143‐747SeoulRepublic of Korea

3. Korea Advanced Institute of Science and TechnologyDaejeonRepublic of Korea

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1049/el.2017.4831

Reference7 articles.

1. Frequency‐selective digital predistortion for unwanted emission reduction;Fu Z.;Trans. Commun.,2015

2. IEC‐61000‐4‐20: ‘Testing and Measurement Techniques – Emission and Immunity Testing in Transverse Electromagnetic (TEM) Waveguides’

3. New Advances on Correlating TEM Cell and OATS Emission Measurements

4. On the New Design of a 4-Port TEM Waveguide with a Higher Cutoff Frequency and Wider Test Volume

5. Simple Method to Generate Dominant E- and H-Fields Inside a Four-Port TEM Cell

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