Synthesis and SAW characteristics of AlN thin films fabricated on Si and GaN using helicon sputtering system

Author:

Chen S.W.,Lin H.F.,Sung T.T.,Wu J.D.,Kao H.L.,Chen J.S.

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering

Cited by 11 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Harsh Environment Materials;Reference Module in Materials Science and Materials Engineering;2016

2. AlN thin film growth using electron cyclotron resonance reactive sputtering;Journal of Physics: Conference Series;2014-11-27

3. Fabrication study of AlN solar-blind (<280 nm) MSM photodetectors grown by low-temperature deposition;physica status solidi (a);2009-08-24

4. Effect of Thermal Annealing on the SAW Properties of AlN Films Deposited on Si Substrate;Journal of the Korean Physical Society;2009-04-15

5. AlN on silicon based surface acoustic wave resonators operating at 5 GHz;Electronics Letters;2009

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