Total Ionizing Dose Effect and Failure Mechanism of Digital Signal Processor-Reference-Cited by-同舟云学术

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Total Ionizing Dose Effect and Failure Mechanism of Digital Signal Processor

Published:2021-09 Issue:5 Volume:30 Page:986-990
ISSN:1022-4653
Container-title:Chinese Journal of Electronics
language:en
Short-container-title:Chin. j. electron.

Author:

Xin YU¹,Wu LU¹,Xiaolong LI¹,Mohan LIU¹,Xin WANG¹,Jing SUN¹,Qi GUO¹

Affiliation:

1. Xinjiang Technical Institute of Physics and ChemistryLaboratory of Solid State Radiation PhysicsUrumchi830011China

Funder

West Light Foundation of the Chinese Academy of Sciences

Publisher

Institution of Engineering and Technology (IET)

Subject

Applied Mathematics,Electrical and Electronic Engineering

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1049/cje.2021.07.010

Reference14 articles.

1. Fault tolerant, radiation hard, high performance digital signal processor (for spacecraft receiver)

2. Radiation characterization of the ADSP2100A digital signal processor;Kinnison J. D.;IEEE Transactions on Nuclear Science,1991

3. Future manned systems advanced avionics study COTS for space

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