Recent progress of graphene orientation determination technology based on scanning probe microscopy-Reference-Cited by-同舟云学术

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Recent progress of graphene orientation determination technology based on scanning probe microscopy

Published:2020-07 Issue:8 Volume:15 Page:519-523
ISSN:1750-0443
Container-title:Micro & Nano Letters
language:en
Short-container-title:Micro & Nano Letters

Author:

Zhang Yu¹,Liu Guangjie¹,Xu Wenjing¹

Affiliation:

1. Department of Computer Science and TechnologyChangchun Normal UniversityChangchun130032People's Republic of China

Funder

National Natural Science Foundation of China

Publisher

Institution of Engineering and Technology (IET)

Subject

Condensed Matter Physics,General Materials Science,Biomedical Engineering,Bioengineering

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1049/mnl.2019.0782

Reference50 articles.

1. International technology roadmap for semiconductors (2013 edition);Huang Q.H.;China Integr. Circuit,2014

2. Short-channel effect in fully depleted SOI MOSFETs

3. Controlling Short-Channel Effects in Deep-Submicron SOI MOSFETs for Improved Reliability: A Review

4. The chips are down for Moore’s law

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