Wave propagation in finite discrete chains unravelled by virtual measurement of dispersion properties

Author:

Wang Zixin1,He Guoqin1,Wang Yichen2,Fan Jiangwei3,Zhang Yumeng4,Chai Yisheng4,Shang Dashan5,Lu Sigma‐Jun6ORCID

Affiliation:

1. School of Electronics and Information Technology Sun Yat‐Sen University Guangzhou China

2. Department of Electrical and Information Technology Lund University Lund Sweden

3. Department of Underwater Systems Systems Engineering Research Institute of CSSC Beijing China

4. School of Physics Chongqing University Chongqing China

5. Institute of Microelectronics Chinese Academy of Sciences Beijing China

6. Institute of Physics Chinese Academy of Sciences Beijing China

Abstract

AbstractTravelling waves in circuit chains are studied to measure continuous dispersion. A lock‐in frequency meter (LIF) is suitable for precisely determining k for each set of waves in finite alternate LC chains, where LIF has been proven to be more accurate than the fast Fourier transform. In addition to the –k measurement, the wave impedance spectrum of the travelling wave can be measured simultaneously, for investigating the dispersion and splitting of pulse propagation. The measured dispersion is validated to be consistent with the derived theoretical equations. The result provides an independent way to precisely obtain dynamical system properties for chains composed of non‐ideal components, such as resistors for researching non‐Hermitian behaviour under dissipation. Systematical mapping of relative deviation dependence of wave dispersion measurement with LIF on different chain length and component variation is studied, indicating boundaries of 1%, 0.1%, and 0.01% precision for guidance of experiments.

Funder

National Key Research and Development Program of China

Youth Innovation Promotion Association of the Chinese Academy of Sciences

National Natural Science Foundation of China

Fujian Institute of Innovation, Chinese Academy of Sciences

Publisher

Institution of Engineering and Technology (IET)

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