Fast circuit model for interaction of open‐ended rectangular waveguide probes with arbitrary‐shape surface cracks in metals-Reference-Cited by-同舟云学术

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Fast circuit model for interaction of open‐ended rectangular waveguide probes with arbitrary‐shape surface cracks in metals

Published:2015-07 Issue:4 Volume:9 Page:427-434
ISSN:1751-8830
Container-title:IET Science, Measurement & Technology
language:en
Short-container-title:IET Science, Measurement & Technology

Author:

Ahanian Iman¹,Sadeghi Seyed Hossein Hesamedin¹,Moini Rouzbeh¹

Affiliation:

1. Department of Electrical EngineeringAmirkabir University of Technology424 Hafez AveTehran15914Iran

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1049/iet-smt.2014.0090

Reference19 articles.

1. Fatigue crack growth of semi-elliptical surface cracks

2. Finite element analysis of a moving magnetic flux type sensor developed for nondestructive testing;Enokizono M.;IEEE Trans. Magn.,1999

3. Analytical Solutions to Eddy‐Current Probe‐Coil Problems

4. Surface magnetic field measurement technique for nondestructive testing of metals;Mirshekar‐Syahkal D.;Electron. Lett.,1994

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