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Near‐binary multisine design with arbitrary sparse spectrum for fast BIS measurement

  • Published:2018-07 Issue:4 Volume:12 Page:448-455
  • ISSN:1751-8830
  • Container-title:IET Science, Measurement & Technology
  • language:en
  • Short-container-title:IET Science, Measurement & Technology

Author:

Zhang Fu1,Teng Zhaosheng1,Yang Yuxiang2,Li Jianmin3,Zhong Haowen4,Sang Jiangyan4

Affiliation:

1. Department of Electronic Science and TechnologyHunan University410082ChangshaPeople's Republic of China

2. Department of Precision Instrumentation EngineeringXi'an University of Technology710048Xi'anPeople's Republic of China

3. Department of Control Science and EngineeringHunan University410082ChangshaPeople's Republic of China

4. Department of Electric EngineeringHunan University410082ChangshaPeople's Republic of China

Funder

National Natural Science Foundation of China

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Low Peak Derivative Sum of Sines;2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC);2021-05-17
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