Investigation of reliability analysis algorithms for effective reliability‐based optimal design of electromagnetic devices-Reference-Cited by-同舟云学术

Investigation of reliability analysis algorithms for effective reliability‐based optimal design of electromagnetic devices

Published:2016-01 Issue:1 Volume:10 Page:44-49
ISSN:1751-8830
Container-title:IET Science, Measurement & Technology
language:en
Short-container-title:IET Science, Measurement & Technology

Author:

Ren Ziyan¹,Zhang Dianhai¹,Koh Chang‐Seop²

Affiliation:

1. School of Electrical EngineeringShenyang University of TechnologyLiaoning110870People's Republic of China

2. College of Electrical EngineeringChungbuk National UniversityCheongju28644ChungbukKorea

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1049/iet-smt.2014.0368

Reference11 articles.

1. Reliability‐based design optimization of a superconducting magnetic energy storage system (SMES) utilizing reliability index approach;Jeung G.W.;J. Magn.,2012

2. A modified reliability index approach for reliability‐based design optimization;Lin P.T.;ASME J. Mech. Des.,2011

3. Enriched performance measure approach for reliability‐based design optimization;Youn B.D.;AIAA J.,2005

4. A new sensitivity‐based reliability calculation algorithm in the optimal design of electromagnetic devices;Ren Z.Y.;J. Electr. Eng. Technol.,2013

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