A dual distance metrics method for improving classification performance-Reference-Cited by-同舟云学术

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A dual distance metrics method for improving classification performance

Published:2020-12-31 Issue:1 Volume:57 Page:13-16
ISSN:0013-5194
Container-title:Electronics Letters
language:en
Short-container-title:Electron. lett.

Author:

Wu Lian¹²^ORCID,Xu Yong³,Zhao Yong¹⁴,Hu Zhijun²,Sun Lilei²

Affiliation:

1. School of Mathematics and Big Data Guizhou Education University Guiyang P.R. China

2. College of Computer Science and Technology Guizhou University Guiyang P.R. China

3. Bio‐Computing Research Center Harbin Institute of Technology Shenzhen P.R. China

4. Shenzhen Graduate School of Peking University Shenzhen P.R. China

Funder

Guizhou Science and Technology Department

Department of Education of Guizhou Province

Guizhou University

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1049/ell2.12016

Reference12 articles.

1. Linear classifier design in the weight space

2. Morphological classifiers

3. Cai S. et al.:A probabilistic collaborative representation based approach for pattern classification.2016 IEEE Conference on Computer Vision and Pattern Recognition Las Vegas NV pp. 2950–2959 (2016)

4. Robust kernel collaborative representation for face recognition

5. Efficient kNN Classification With Different Numbers of Nearest Neighbors

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