Electrical approach to defect depth estimation by stepped infrared thermography-Reference-Cited by-同舟云学术

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Electrical approach to defect depth estimation by stepped infrared thermography

Published:2004-07-01 Issue:4 Volume:151 Page:298-304
ISSN:1350-2344
Container-title:IEE Proceedings - Science, Measurement and Technology
language:en
Short-container-title:

Author:

Gupta R.,Tuli S.

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering

Link

https://digital-library.theiet.org/content/journals/10.1049/ip-smt_20040564?crawler=true&mimetype=application/pdf

Reference23 articles.

1. Maldague, X.P.V.: ‘Theory and practice of infrared technology for nondestructive testing’, (Wiley, New York 2001)

2. Maldague, X.P.V., Infrared and thermal testing: nondestructive testing Handbook, 3rd(ASNT, USA 2001),3, p. 411–439

3. Surface transient temperature inversion for hidden corrosion characterisation: theory and applications

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