Remote Attestation for Intelligent Electronic Devices in Smart Grid Based on Trusted Level Measurement-Reference-Cited by-同舟云学术

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Remote Attestation for Intelligent Electronic Devices in Smart Grid Based on Trusted Level Measurement

Published:2020-05 Issue:3 Volume:29 Page:437-446
ISSN:1022-4653
Container-title:Chinese Journal of Electronics
language:en
Short-container-title:Chin. j. electron.

Author:

Wang Yong¹,Li Jun'e¹,Chen Xiong²³⁴,Lin Hai¹,Yu Fajiang¹,Luo Jianbo²³⁴

Affiliation:

1. Key Laboratory of Aerospace Information Security and Trusted ComputingMinistry of EducationSchool of Cyber Science and EngineeringWuhan UniversityWuhan430072China

2. NARI Group CorporationState Grid Electric Power Research InstituteNanjing211106China

3. NARI Technology Co. Ltd.Nanjing211106China

4. State Key Laboratory of Smart Grid Protection and ControlNanjing211106China

Publisher

Institution of Engineering and Technology (IET)

Subject

Applied Mathematics,Electrical and Electronic Engineering

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1049/cje.2020.02.019

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Design of a Customized Intelligent Electronic Device for Power Circuit Safety;September 2022;2022-09-05

2. Non‐intrusive Load Monitoring Using Gramian Angular Field Color Encoding in Edge Computing;Chinese Journal of Electronics;2022-07

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