Nondestructive optical technique for electrically testing insulated-gate integrated circuits
Author:
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Link
https://digital-library.theiet.org/content/journals/10.1049/el_19710291?crawler=true&mimetype=application/pdf
Reference1 articles.
Cited by 24 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Thermophysical Properties of Cholesteryl Oleyl Carbonate Determined with Microscopic Ftir/Dsc System;Journal of the Chinese Chemical Society;1995-10
2. Study on corrosion properties of sputter coating of oxides on stainless steels;Materials Science and Engineering: A;1995-07
3. Investigation of some aspects of the liquid crystal optical voltage contrast technique for integrated circuit physical analysis;Microelectronics Reliability;1994-04
4. Applications of Electrooptical Liquid Crystalline Materials;Partially Ordered Systems;1994
5. Electro-Optic LC Methods for Non-Destructive Testing of Solid Surfaces;Molecular Crystals and Liquid Crystals;1991-12
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