Frequency dependence of negative-capacitance effects observed in amorphous semiconductor thin-film devices-Reference-Cited by-同舟云学术

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Frequency dependence of negative-capacitance effects observed in amorphous semiconductor thin-film devices

Published:1971 Issue:24 Volume:7 Page:706
ISSN:0013-5194
Container-title:Electronics Letters
language:en
Short-container-title:Electron. Lett.

Author:

Allison J.,Dawe V.R.

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering

Link

https://digital-library.theiet.org/content/journals/10.1049/el_19710484?crawler=true&mimetype=application/pdf

Reference3 articles.

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Temperature and Frequency Dependent Dielectric Properties of Cu0.5Tl0.5Ba2Ca3(Cu4−y Cd y )O12−δ Bulk Superconductor;Journal of Low Temperature Physics;2012-12-05

2. Cu0.5K0.25Tl0.25Ba2Ca3Cu4O12-δ SUPERCONDUCTOR AND ITS DIELECTRIC PROPERTIES;Modern Physics Letters B;2010-12-30

3. RETRACTED ARTICLE: AC-field Frequency Response of Cu0.5Tl0.5Ba2(Ca2−q Mg q )Cu3O10−δ Bulk Superconductor;Journal of Superconductivity and Novel Magnetism;2010-08-14

4. Dielectric properties of Cu0.5Tl0.5Ba2Ca3Cu4O12−δ bulk superconductor;Physica C: Superconductivity;2009-07

5. Dielectric response of Cu0.5Tl0.5Ba2(Ca2−yMgy)(Cu0.5Zn2.5)O10−δ bulk superconductor to frequency and temperature;Physica C: Superconductivity;2009-02

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