Programmable CCCII: reliability analysis and design methodology-Reference-Cited by-同舟云学术

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Programmable CCCII: reliability analysis and design methodology

Published:2019-05-31 Issue:4 Volume:13 Page:487-493
ISSN:1751-858X
Container-title:IET Circuits, Devices & Systems
language:en
Short-container-title:IET Circuits, Devices & Systems

Author:

Tiwari Manoj Kumar¹,Pandey Neeta²,Paul Sajal K.³,Rizvi Saiyid Mohammad Irshad¹

Affiliation:

1. Department of PIMDS (TR&D)STMicroelectronics Pvt. Ltd.Greater NoidaIndia

2. Department of Electronics and Communication EngineeringDelhi Technological UniversityNew DelhiIndia

3. Depatment of Electronics EngineeringIndian Institute of Technology (Indian School of Mines)DhanbadIndia

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering,Control and Systems Engineering

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1049/iet-cds.2018.5165

Reference26 articles.

1. Design For Degradation : CAD Tools for Managing Transistor Degradation Mechanisms

2. Compact Modeling and Simulation of Circuit Reliability for 65-nm CMOS Technology

3. 5.5-V I/O in a 2.5-V 0.25-μm CMOS technology

4. Power sequence free 400Mbps 90µW 6000µm² 1.8V–3.3V stress tolerant I/O buffer in 28nm CMOS

5. A 73μW 400Mbps stress tolerant 1.8V-3.6V driver in 40nm CMOS

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Reliability Analysis of Radiation Tolerant Low Voltage CCCII Circuit For Space Applications;Defence Science Journal;2022-12-06

2. Realization of Seventh-Order Chebyshev Active Low-Pass Filter;Recent Advances in Electrical & Electronic Engineering (Formerly Recent Patents on Electrical & Electronic Engineering);2022-02

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