Measuring the unloaded, loaded, and external quality factors of one- and two-port resonators using scattering-parameter magnitudes at fractional power levels-Reference-Cited by-同舟云学术

Measuring the unloaded, loaded, and external quality factors of one- and two-port resonators using scattering-parameter magnitudes at fractional power levels

Published:2004 Issue:4 Volume:151 Page:345
ISSN:1350-2417
Container-title:IEE Proceedings - Microwaves, Antennas and Propagation
language:en
Short-container-title:IEE Proc., Microw. Antennas Propag.

Author:

Bray J.R.,Roy L.

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering,Computer Networks and Communications

Link

https://digital-library.theiet.org/content/journals/10.1049/ip-map_20040521?crawler=true&mimetype=application/pdf

Reference19 articles.

1. Unloaded Q measurement-the critical points method

2. Determination of Loaded, Unloaded, and External Quality Factors of a Dielectric Resonator Coupled to a Microstrip Line

3. Precise measurements of the Q factor of dielectric resonators in the transmission mode-accounting for noise, crosstalk, delay of uncalibrated lines, coupling loss, and coupling reactance

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