Retrieval of electrical and physical properties of dielectric samples using time‐domain multiple reflection method-Reference-Cited by-同舟云学术

Retrieval of electrical and physical properties of dielectric samples using time‐domain multiple reflection method

Published:2020-05-19 Issue:8 Volume:14 Page:701-706
ISSN:1751-8733
Container-title:IET Microwaves, Antennas & Propagation
language:en
Short-container-title:IET Microwaves, Antennas & Propagation

Author:

Aman ¹,Singh Vineet¹,Bhattacharyya Somak¹^ORCID

Affiliation:

1. Department of Electronics EngineeringIndian Institute of Technology (BHU)VaranasiIndia

Funder

Science and Engineering Research Board

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1049/iet-map.2019.0203

Reference24 articles.

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3. Akuthota B. Zoughi R. Kurtis K.E.: ‘Determination of dielectric property profile in cement‐based materials using microwave reflection and transmission properties’.Proc. of the 21st IEEE Instrumentation and Measurement Technology Conf. (IEEE Cat. No. 04CH37510) Como Italy May2004 Vol.1 pp.327–332

4. Characterisation of layered dielectric medium using reflection coefficient

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