Embedded high-resolution delay measurement system using time amplification
Author:
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Link
https://digital-library.theiet.org/content/journals/10.1049/iet-cdt_20060099?crawler=true&mimetype=application/pdf
Reference31 articles.
1. Russell, G., and Sayers, I.L.: ‘Advanced simulation and test methodologies for VLSI design’, (Van Nostrand Reinhold (International) 1989)
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