Multi-mode-segmented scan architecture with layout-aware scan chain routing for test data and test time reduction-Reference-Cited by-同舟云学术

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Multi-mode-segmented scan architecture with layout-aware scan chain routing for test data and test time reduction

Published:2008 Issue:6 Volume:2 Page:434
ISSN:1751-8601
Container-title:IET Computers & Digital Techniques
language:en
Short-container-title:IET Comput. Digit. Tech.

Author:

Tsai P.-C.,Wang S.-J.

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Link

https://digital-library.theiet.org/content/journals/10.1049/iet-cdt_20070115?crawler=true&mimetype=application/pdf

Reference39 articles.

1. Low Power Test Compression Technique for Designs with Multiple Scan Chain

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Physical Aware Approaches for Speeding up Scan Shift Operation in SoC;ETRI Journal;2016-01-19

2. Multiple Scan Trees Synthesis for Test Time/Data and Routing Length Reduction Under Output Constraint;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2010-04

3. Nano-scale quasi-melting of alkali-borosilicate glasses under electron irradiation;Journal of Nuclear Materials;2010-01

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