Experimental determination of carrier-induced differential loss in 2-section GaInAsP/InP laser-waveguide-Reference-Cited by-同舟云学术

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Experimental determination of carrier-induced differential loss in 2-section GaInAsP/InP laser-waveguide

Published:1989 Issue:24 Volume:25 Page:1623
ISSN:0013-5194
Container-title:Electronics Letters
language:en
Short-container-title:Electron. Lett.

Author:

Brosson P.,Labourie C.,Le Gouezigou L.,Lievin J.L.,Jacquet J.,Leblond F.,Olivier A.,Leclerc D.

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering

Link

https://digital-library.theiet.org/content/journals/10.1049/el_19891087?crawler=true&mimetype=application/pdf

Reference6 articles.

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Analysis of Threshold Characteristics of Short-Wavelength Semiconductor Lasers;IEEE Photonics Journal;2024-04

2. 1/f NOISE IN DBR TUNABLE LASERS;Fluctuation and Noise Letters;2006-03

3. Bragg Section Effects on Linewidth and Lineshape in 1.55-<tex>$mu $</tex>m DBR Tunable Laser Diodes;IEEE Photonics Technology Letters;2004-06

4. Determination of carrier-induced optical index and loss variations in GaInAsP∕InP heterostructures from static and dynamic Mach-Zehnder interferometer measurements;Electronics Letters;2004

5. High Power Semiconductor Lasers for EDFA Pumping;WDM Technologies;2002

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