Fault tolerance and reliability in field-programmable gate arrays
Author:
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Link
https://digital-library.theiet.org/content/journals/10.1049/iet-cdt.2009.0011?crawler=true&mimetype=application/pdf
Reference70 articles.
1. McClintock, C.: ‘Redundancy circuitry for logic circuits’, U.S., (66 166 559)
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