Author:
Chen Z.,Feng J.,Yin B.,Xiang D.
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Reference34 articles.
1. Bushnell, M., and Agrawal, V.D.: ‘Essentials of electronic testing’, (Kluwer Academic Publishers 2000)
2. An analysis of power reduction techniques in scan testing
Cited by
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