Hi‐Z fault location identification on low voltage distribution systems using IoT‐based digital twin model computation

Author:

Pamulaparthy Balakrishna12ORCID

Affiliation:

1. Department of Electrical Engineering Indian Institute of Technology Madras (IITM) Chennai India

2. GE Grid Automation CoE Hyderabad Technology Center Hyderabad India

Abstract

AbstractDistribution feeders carry and supply power to industrial, commercial and residential loads from the point where sub‐transmission (33 kV level) ends after stepping down to suitable voltages, such as 11 kV and further down to 400/230 V. In recent times, high impedance (Hi‐Z) faults on distribution systems are creating unique challenges to utilities both from operational and safety perspectives. Most of these Hi‐Z faults occur at distribution voltages of 15 kV or below, with the problem being worse at lower voltages. Hi‐Z fault detection technologies emerged and were developed and incorporated on embedded platforms, such as relays, reclosers and sensors, which protect and monitor distribution systems. Although these technologies can detect Hi‐Z fault on feeders, most of them cannot identify the exact location of the fault. Specifically, there is no solution available in literature for detecting Hi‐Z fault location on low voltage (LV) circuits like 3‐phase 4‐wire 400 V distribution network. In this paper, we introduce a novel and a unique algorithm to identify the location of Hi‐Z faults using proposed smart metres IoT data‐based distribution system load flow and digital twin model representation of the network. Furthermore, a case study on the standard 33 bus LV system clearly depicts the functionality of the proposed algorithm.

Publisher

Institution of Engineering and Technology (IET)

Reference23 articles.

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