Author:
Lee Kuen-Jong,Wen Yun-Che
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Reference3 articles.
1. IEEE Computer Society. ‘IEEE P 1149.4 Standard for a Mixed-Signal Test Bus, Draft D16’. IEEE Computer Society Press Tutorial, 1997
2. Analogue boundary scan architecture for DC and AC testing
3. DC control and observation structures for analog circuits
Cited by
1 articles.
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1. Analysis and generation of control and observation structures for analog circuits;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2001