Computer-aided thermal analysis of reverse-biased PIN diodes-Reference-Cited by-同舟云学术

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Computer-aided thermal analysis of reverse-biased PIN diodes

Published:1984 Issue:3 Volume:131 Page:82
ISSN:0143-7100
Container-title:IEE Proceedings I Solid State and Electron Devices
language:en
Short-container-title:IEE Proc. I Solid State Electron. Devices UK

Author:

Ramamurthy V.,Bhat K.N.,Kakati D.

Publisher

Institution of Engineering and Technology (IET)

Subject

General Engineering

Link

https://digital-library.theiet.org/content/journals/10.1049/ip-i-1.1984.0024?crawler=true&mimetype=application/pdf

Reference14 articles.

1. Mortenson, K.E., and Borrego, J.M.: Design, performance and applications of microwave semiconductor control components, (Artech House Inc. 1972), p. 140–149

2. BROWN, W.D.: ‘Semiconductor degradation by high amplitude current pulses’. Sandia Labs., Document Dc-DC-72-2288, Albuquerque, NM, USA, July 1972

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