Temperature measurements of thin films on substrates-Reference-Cited by-同舟云学术

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Temperature measurements of thin films on substrates

Published:1985 Issue:3 Volume:132 Page:143
ISSN:0143-7100
Container-title:IEE Proceedings I Solid State and Electron Devices
language:en
Short-container-title:IEE Proc. I Solid State Electron. Devices UK

Author:

de Cogan D.,Howe A.F.,Webb P.W.

Publisher

Institution of Engineering and Technology (IET)

Subject

General Engineering

Link

https://digital-library.theiet.org/content/journals/10.1049/ip-i-1.1985.0029?crawler=true&mimetype=application/pdf

Reference5 articles.

1. Wright, A., and Newbery, P.G.: Electric fuses, (Peter Peregrinus 1982)

2. Touloukian, Y.S., Buyco, E.H., Thermophysical properties of matter, 5, p. 202 (for silica),p.24 (for alumina)

3. Powell, R.W., Ho, C.Y., and Liley, P.E.: Thermal conductivity of selected materials, (NSRDS NBS-8, Fig. 14

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Thermal effects in thin conducting films on silica and alumina substrates under near-adiabatic conditions;Journal of Physics D: Applied Physics;1987-11-14

2. TLM modelling of the thermal behaviour of conducting films on insulating substrates;Journal of Physics D: Applied Physics;1987-11-14

3. Nonlinear thermal effects in thin-film conductors on insulating substrates;Electronics Letters;1987-05-21

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