Author:
Menon S.M.,Jayasumana A.P.,Malaiya Y.K.,Clinkinbeard D.R.
Publisher
Institution of Engineering and Technology (IET)
Subject
General Earth and Planetary Sciences,General Environmental Science
Cited by
5 articles.
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1. A New Perspective on ECL Circuits;Applied Mechanics and Materials;2014-09
2. ECL storage elements: modeling of faulty behavior;IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing;1997
3. Fault Modeling of ECL for High Fault Coverage of Physical Defects;VLSI Design;1996-01-01
4. Design for testability method for CML digital circuits;Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)
5. Tools for the characterization of bipolar CML testability;Proceedings 19th IEEE VLSI Test Symposium. VTS 2001