Face Recognition Using Dense SIFT Feature Alignment-Reference-Cited by-同舟云学术

Face Recognition Using Dense SIFT Feature Alignment

Published:2016-11 Issue:6 Volume:25 Page:1034-1039
ISSN:1022-4653
Container-title:Chinese Journal of Electronics
language:en
Short-container-title:Chin. j. electron.

Author:

Zhou Quan¹,Shafiq ur Rehman²,Zhou Yu³,Wei Xin¹,Wang Lei¹,Zheng Baoyu¹

Affiliation:

1. Key Lab of Ministry of Education for Broad Band Communication and Sensor Network TechnologyNanjing University of Posts and TelecommunicationsNanjing210003China

2. Department of Applied Physics and ElectronicsUmeå UniversityUmeåSweden

3. School of Computer ScienceBeijing University of Posts and TelecommunicationsBeijing100876China

Funder

National Natural Science Foundation of China

China Postdoctoral Science Foundation

Publisher

Institution of Engineering and Technology (IET)

Subject

Applied Mathematics,Electrical and Electronic Engineering

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1049/cje.2016.10.001

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