Process compensated bipolar junction transistor‐based CMOS temperature sensor with a ±1.5°C (3σ) batch‐to‐batch inaccuracy-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Process compensated bipolar junction transistor‐based CMOS temperature sensor with a ±1.5°C (3σ) batch‐to‐batch inaccuracy

Published:2018-11 Issue:22 Volume:54 Page:1270-1272
ISSN:0013-5194
Container-title:Electronics Letters
language:en
Short-container-title:Electron. lett.

Author:

Sun Dapeng¹,Zhang Tan‐Tan¹,Law Man‐Kay²,Mak Pui‐In¹,Martins Rui Paulo¹

Affiliation:

1. State‐Key Laboratory of Analog and Mixed‐Signal VLSI and Faculty of Science and Technology‐Electrical and Computer EngineeringUniversity of MacauMacau999078People's Republic of China

2. State Key Laboratory of Analog and Mixed‐Signal VLSIUniversity of MacauMacau999078People's Republic of China

Funder

Fundo para o Desenvolvimento das Ciências e da Tecnologia

Universidade de Macau

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1049/el.2018.6447

Reference7 articles.

1. BJT Process Spread Compensation Utilizing Base Recombination Current in Standard CMOS

2. Piecewise BJT process spread compensation exploiting base recombination current

3. A temperature estimation method using the ratio of emitter‐to‐base voltages;Rehman S.U.;Trans. Very Large Scale Integr. (VLSI) Syst.,2017

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A 0.037 pJ K2$\text{K}^2$ 338 pW temperature sensor based on dynamic leakage‐suppression logic;Electronics Letters;2024-08

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP