Singular value decomposition combined with wavelet transform for LCD defect detection
Author:
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Link
https://digital-library.theiet.org/content/journals/10.1049/el.2011.3746?crawler=true&mimetype=application/pdf
Reference9 articles.
1. Automatic defect inspection for LCDs using singular value decomposition
2. Defect Detection of TFT-LCD Image Using Adapted Contrast Sensitivity Function and Wavelet Transform
3. Independent component analysis-based defect detection in patterned liquid crystal display surfaces
4. A New Mura Defect Inspection Way for TFT-LCD Using Level Set Method
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